[ RadSafe ] Interlock question
Ted de Castro
tdc at xrayted.com
Mon Oct 27 20:11:23 CDT 2014
Specifically - analytical x-ray machine ....
On 10/27/2014 2:27 PM, Ted de Castro wrote:
> I am dealing with an x-ray machine interlock design.
>
> Of course it will be redundant and failsafe and testable - but the
> question has come up regarding using semiconductor devices in the
> interlock circuit.
>
> When I was the x-ray safety officer at a national laboratory I
> resolved that issue by simply not accepting semiconductor devices in
> interlock circuits - problem solved.
>
> I maintained that when such included logic circuits that showing that
> its was failsafe with the failure of any single component could not be
> demonstrated - even disregarding issues with defining what constituted
> a "component".
>
> Further testing requires that each component be isolated, exercised
> and tested - and I maintained that is simply not possible with logic
> circuits. ie. - just opening the door and observing that the x-rays
> turn off is most definitely NOT a test!
>
> Its not as simple anymore.
>
> I have heard however that there is a euro standard that prohibits the
> use of semiconductor devices in interlock circuits. So - I was hoping
> someone here might know IF that were in fact so - and if so shat that
> standard is.
>
> Thanks
>
> Ted de Castro
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